000 -LEADER |
fixed length control field |
00732 a2200217 4500 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
548.83 |
Item number |
In8m2 |
100 ## - MAIN ENTRY--PERSONAL NAME |
Personal name |
Amelinckx, S. |
245 1# - TITLE STATEMENT |
Title |
DIFFRACTION AND IMAGING TECHNIQUES IN MATERIAL SCIENCE |
250 ## - EDITION STATEMENT |
Edition statement |
2nd rev. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
Amsterdam |
Name of publisher, distributor, etc. |
North-Holland |
Date of publication, distribution, etc. |
1978 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
2 v.,847 |
500 ## - GENERAL NOTE |
General note |
Contents. -- V. 1. Electron Microscopy. -- V. 2. Imaging And Diffraction Techniques |
500 ## - GENERAL NOTE |
General note |
Contains New Contributions, Besides Updated And Reworked Papers Of The 1969 Course |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Electrons -- Diffraction -- Congresses |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Imaging Systems -- Congresses |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Electron Miscroscopy -- Congresses |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Gevers, R. |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
|
964 ## - |
-- |
CIRC |
997 ## - |
-- |
A60624 v. 2 C |