| 000 -LEADER |
|---|
| fixed length control field |
00425 a2200145 4500 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
537.622 |
| Item number |
In85L |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Hasiguti, Ryukiti R. |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
LATTICE DEFECTS IN SEMICONDUCTORS |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Tokyo |
| Name of publisher, distributor, etc. |
University Of Tokyo Press |
| Date of publication, distribution, etc. |
c1968 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
ix,513 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Crystals. Defects. Addresses, Essays, Lectures |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors. Addresses, Essays, Lectures |
| 964 ## - |
|---|
| -- |
CIRC |
| 997 ## - |
|---|
| -- |
A10781 C |
