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Measurment techniques for thin films (Record no. 457510)

000 -LEADER
fixed length control field 00443n a2200169ua 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
040 ## - CATALOGING SOURCE
Transcribing agency IIT Kanpur
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 530.41
Item number M463
100 ## - MAIN ENTRY--AUTHOR NAME
Personal name Schwartz, Bertram
245 0# - TITLE STATEMENT
Title Measurment techniques for thin films
Statement of responsibility, etc edited by Bertram Schwartz and others
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication New York
Name of publisher The Electrochemical Society
Year of publication 1967
300 ## - PHYSICAL DESCRIPTION
Number of Pages vi, 364p
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Physics
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Schwartz, Bertram (Ed.)
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Permanent Location Current Location Date acquired Full call number Accession Number Uniform Resource Identifier Koha item type
        COMPACT STORAGE (BASEMENT) PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 2015-08-19 530.41 M463 A1026 Book Request Books

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