| 000 -LEADER |
|---|
| fixed length control field |
00562 a2200169 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
OSt |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
IIT Kanpur |
| 041 ## - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
669.950282 |
| Item number |
Sy68t |
| 110 ## - MAIN ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
A.S.T.M. |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
Techniques of electron microscopy, diffraction and microprobe analysis |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication |
Philadelphia |
| Name of publisher |
American Society for Testing and Materials |
| Year of publication |
1964 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Number of Pages |
89p |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
ASTM special technical publication; 372 |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Sponsored by subcommittee Xi on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Books |
