| 000 -LEADER |
|---|
| fixed length control field |
00439pam a2200145a 44500 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
NASA |
| Item number |
TN D-1161 - |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Harrell,Shelley |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
ELECTRON AND MICROSCOPY TECHNIQUES SUITABLE FOR STUDYING FATIGUE DAMAGE IN A CRYSTALLIZED GLASS CERAMIC\ |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
|
| Name of publisher, distributor, etc. |
Nasa, Washington, D.C. |
| Date of publication, distribution, etc. |
1961 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
16 |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Bound With Nasa Tn D-1161-1170 |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Zaretsky,Erwin V. |
| 964 ## - |
|---|
| -- |
CIRC |
| 997 ## - |
|---|
| -- |
65516 C |
