| 000 -LEADER |
|---|
| fixed length control field |
00625pam a2200181a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b2016 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9789814630351 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
P K Kelkar Library, IIT Kanpur |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
502.82 |
| Item number |
R272f |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Reifenberger, Ronald |
| 245 0# - TITLE STATEMENT |
|---|
| Title |
Fundamentals of atomic force microscopy |
| Statement of responsibility, etc. |
Ronald Reifenberger |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New Jersey |
| Name of publisher, distributor, etc. |
World Scientific |
| Date of publication, distribution, etc. |
2016 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xv, 324p |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
Lessons From Nanoscience : A Lecture Note Series / Edited By Mark Lundstrom |
| Volume/sequential designation |
V.4 |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Contents: pt.1. Foundations |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Atomic force microscopy |
| 997 ## - |
|---|
| -- |
A182088 C |
