| 000 -LEADER |
|---|
| fixed length control field |
00857pam a2200217a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b2012 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9789814322805 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
IIT, Kanpur |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.5 |
| Item number |
H191 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
|
| 245 0# - TITLE STATEMENT |
|---|
| Title |
Handbook of instrumentation and techniques for semiconductor nanostructure characterization [2 v.] |
| Statement of responsibility, etc. |
edited by Richard Haight, Frances M. Ross and James B. Hannon |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New Jersey |
| Name of publisher, distributor, etc. |
World Scientific |
| Date of publication, distribution, etc. |
2012 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
2 v.(xxiv, 312p, xxiv, 313-610p) |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
Materials And Energy / Edited By Leonard C. Feldman |
| Volume/sequential designation |
|
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductor |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
optical properties |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Nanostructure materials -- Optical properties |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors -- Optical properties |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Haight, Richard, Ed. |
| 997 ## - |
|---|
| -- |
A173504 vol.1 C A173505 vol.2 C |
