Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

SCANNING PROBE MICROSCOPY (Record no. 355569)

000 -LEADER
fixed length control field 00550pam a2200181a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160408b2007 xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0387286675
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 502.825
Item number SC63
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kalinin,Sergei
245 1# - TITLE STATEMENT
Title SCANNING PROBE MICROSCOPY
Statement of responsibility, etc. ELECTRICAL AND ELECTROMECHANICAL PHENOMENA AT THE NANOSCALE
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.
Name of publisher, distributor, etc. Springer Science+Business Media Inc., New York
Date of publication, distribution, etc. 2007
300 ## - PHYSICAL DESCRIPTION
Extent 2v.,
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Scanning Probe Microscopy
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Nanoelectronics
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Gruverman,Alexei
964 ## -
-- CIRC
997 ## -
-- A157366 C
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Permanent Location Current Location Date acquired Full call number Barcode Date last seen Price effective from Koha item type
        General Stacks PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 2007-08-12 502.825 SC63 A157366 2016-04-08 2016-04-08 Books

Powered by Koha