| 000 -LEADER |
|---|
| fixed length control field |
00689pam a2200217a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b1995 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
1558992812 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.38152 |
| Item number |
D361 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
S No Ashok |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
DEFECT AND IMPURITY ENGINEERED SEMICONDUCTORS AND DEVICES |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
|
| Name of publisher, distributor, etc. |
Materials Research Society,Pittsburgh |
| Date of publication, distribution, etc. |
1995 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xxi,1054 |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
Materials Research Society |
| Volume/sequential designation |
Symposium Proceedings |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Symposium Held April 17-21,1995,Sanfrancisco. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors -- Defects |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors -- Impurity Distribution |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Ashok,S |
| 964 ## - |
|---|
| -- |
CIRC |
| 997 ## - |
|---|
| -- |
A130428 s C |
