000 -LEADER |
fixed length control field |
00629pam a2200205a 44500 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
OSt |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
160408bc1994 xxu||||| |||| 00| 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
ISBN |
0750302941 |
040 ## - CATALOGING SOURCE |
Transcribing agency |
IIT Kanpur |
041 ## - LANGUAGE CODE |
Language code of text/sound track or separate title |
eng |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
541.377 |
Item number |
D361J |
245 1# - TITLE STATEMENT |
Title |
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES |
Statement of responsibility, etc |
edited by J. Jimenez |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Name of publisher |
Institute Of Physics |
Year of publication |
c1994 |
Place of publication |
Bristol |
300 ## - PHYSICAL DESCRIPTION |
Number of Pages |
xx,417 |
500 ## - GENERAL NOTE |
General note |
Proc. Of The Fifth International Conference, Spain, 1993 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Term |
Semiconductors -- Cong |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Term |
Semiconductor Devices -- Cong |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Jimenez, J., [ed.] |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
Books |