| 000 -LEADER |
|---|
| fixed length control field |
00506pam a2200181a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b1977 xxu||||| |||| 00| 0 eng d |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
548.9 |
| Item number |
El25 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Hirsch, Peter |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
ELECTRON MICROSCOPY OF THIN CRYSTALS |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Huntington, N. Y. |
| Name of publisher, distributor, etc. |
Robert E. Krieger Pub. |
| Date of publication, distribution, etc. |
1977 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
563 |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Bibliographical References |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Electron Microscope |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Electrons -- Diffraction |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Crystallography |
| 964 ## - |
|---|
| -- |
CIRC |
| 997 ## - |
|---|
| -- |
A53826 C |
