| 000 -LEADER |
|---|
| fixed length control field |
00632pam a2200205a 44500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20170329105308.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b1980 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| ISBN |
0854981438 |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
IITK |
| 041 ## - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
535.3325 |
| Item number |
D492 1980 |
| 111 ## - MAIN ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
Conference |
| Location of meeting |
Brighton |
| Date of meeting |
1979 |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
Electron microscopy and analysis, 1979 (EMAG 79) |
| Remainder of title |
proceedings... |
| Statement of responsibility, etc |
edited by T. Mulvey |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication |
Bristol |
| Name of publisher |
Institute Of Physics |
| Year of publication |
1980 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Number of Pages |
xv |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
The Institute of Physics. Conference Series Number; 52 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Electron Microscopy -- Congresses |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Mulvey, T., ed. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Books |
