000 -LEADER |
fixed length control field |
00578pam a2200217a 44500 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
OSt |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20230118123749.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
160408b1984 xxu||||| |||| 00| 0 eng d |
040 ## - CATALOGING SOURCE |
Transcribing agency |
IIT Kanpur |
041 ## - LANGUAGE CODE |
Language code of text/sound track or separate title |
eng |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620.43 |
Item number |
P258b |
245 1# - TITLE STATEMENT |
Title |
PARTICLE CHARACTERIZATION IN TECHNOLOGY |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication |
Boca Raton |
Name of publisher |
Crc Press |
Year of publication |
1984 |
300 ## - PHYSICAL DESCRIPTION |
Number of Pages |
265p |
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
Title |
Crc Series on Fine Particle Science and Technology |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Term |
Particles |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Term |
Bulk Solids |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Term |
Particle Size Determination |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Beddow, John Keith [ed.] |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
Books |