| 000 -LEADER |
|---|
| fixed length control field |
00421pam a2200157a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b1981 xxu||||| |||| 00| 0 eng d |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
537.622 |
| Item number |
R197i |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Ravi, K. V. |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
IMPERFECTIONS AND IMPURITIES IN SEMICONDUCTOR SILICON |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New York |
| Name of publisher, distributor, etc. |
John Wiley |
| Date of publication, distribution, etc. |
1981 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xiv,379 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Silicon |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors -- Defects |
| 964 ## - |
|---|
| -- |
CIRC |
| 997 ## - |
|---|
| -- |
A67317 C |
