| 000 -LEADER |
|---|
| fixed length control field |
00635pam a2200229a 44500 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20211215110359.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b1981 xxu||||| |||| 00| 0 eng d |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
IIT Kanpur |
| 041 ## - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
537.622 |
| Item number |
L284p |
| 100 ## - MAIN ENTRY--AUTHOR NAME |
|---|
| Personal name |
Lannoo, M. |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
POINT DEFECTS IN SEMICONDUCTORS |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication |
Berlin |
| Name of publisher |
Springer-Verlag |
| Year of publication |
1981 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Number of Pages |
265p |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
Springer series in solid state sciences |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Contents: v. 1. Theoretical aspects. -- v. 2. experimental Aspects |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Point defects |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Semiconductors -- Defects |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Bourgoin, J. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Books |
