| 000 -LEADER |
|---|
| fixed length control field |
00420pam a2200157a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b1970 xxu||||| |||| 00| 0 eng d |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
669.950282 |
| Item number |
T574 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Tolansky, S. |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
MULTIPLE-BEAM INTERFERENCE MICROSCOPY OF METALS |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
London |
| Name of publisher, distributor, etc. |
Academic Press |
| Date of publication, distribution, etc. |
1970 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
147 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Interference Microscope |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Metallography |
| 964 ## - |
|---|
| -- |
CIRC |
| 997 ## - |
|---|
| -- |
A28184 C |
