530.41
Rein, Stefan.
Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications / [electronic resource] : / by Stefan Rein. .- XXVI, 492 p.. online resource. ** Springer Series in Material Science, * 85 0933-033X ; )
QC176-176.9 - Springer Series in Material Science, 85 .
ISBN: 9783540279228
10.1007/3-540-27922-9 doi
Subject Headings:
Physics.;
Solid state physics.;
Spectroscopy.;
Microscopy.;
Optical materials.;
Electronic materials.;
Physics.;
Solid State Physics.;
Spectroscopy and Microscopy.;
Optical and Electronic Materials.;
Copy Details:
Acc. No.: EBK6786, Full Call No.: , Item type: E books , Location: ,
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Rein, Stefan.
Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications / [electronic resource] : / by Stefan Rein. .- XXVI, 492 p.. online resource. ** Springer Series in Material Science, * 85 0933-033X ; )
QC176-176.9 - Springer Series in Material Science, 85 .
ISBN: 9783540279228
10.1007/3-540-27922-9 doi
Subject Headings:
Physics.;
Solid state physics.;
Spectroscopy.;
Microscopy.;
Optical materials.;
Electronic materials.;
Physics.;
Solid State Physics.;
Spectroscopy and Microscopy.;
Optical and Electronic Materials.;
Copy Details:
Acc. No.: EBK6786, Full Call No.: , Item type: E books , Location: ,
------------------------- --------------------- ------ --------- ------- ------- --------- --------