Normal view MARC view ISBD view

Atomic force microscopy

By: Voigtländer, Bert.
Series: Nanoscience and technology / edited by Phaedon Avouris. Publisher: Switzerland Springer 2019Edition: 2nd ed.Description: xiv, 331p.ISBN: 9783030136536.Subject(s): Atomic force microscopy -- Technology and engineeringDDC classification: 620.5 | V87a2 Summary: This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
List(s) this item appears in: New arrival August 05 to 12, 2019
    average rating: 0.0 (0 votes)
Item type Current location Collection Call number Status Date due Barcode Item holds
Books Books P K Kelkar Library, IIT Kanpur
General Stacks 620.5 V87a2 (Browse shelf) Available A184563
Total holds: 0

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

There are no comments for this item.

Log in to your account to post a comment.

Powered by Koha