Illinois Institute of Technology
Contributor(s): SpringerLink (Online service).Material type: BookSeries: The Campus Guide: Publisher: New York, NY : Princeton Archit.Press, 2005.Description: 111 p. 112 illus., 72 illus. in color. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9781568986500.Subject(s): Architecture | Architecture / Design | Architecture, generalDDC classification: 720 Online resources: Click here to access online
|Item type||Current location||Call number||Status||Date due||Barcode||Item holds|
|E books||P K Kelkar Library, IIT Kanpur||Available||EBK20|
Walking Tour -- Walk, Part I -- Walk, Part II -- Walk, Part III -- Mies van der Rohe—A Short Biography -- Mies van der Rohe—A Short Biography.
vii viii THE CAMPUS GUIDE Illinois Institute of Technology an architectural tour by Franz Schulze with photographs by Richard Barnes foreword by Lew Collens Princeton Architectural Press NEW YORK 2005 Princeton Architectural Press 37 East Seventh Street New York, New York 10003 For a free catalog of books, call 1.800.722 .6657. Visit our web site at www.papress.com. Copyright © 2005 Princeton Architectural Press All rights reserved 08070605 54321 First edition No part of this book may be used or reproduced in any manner without written permission from the publisher, except in the context of reviews. Every reasonable attempt has been made to identify owners of copyright. Errors or omissions will be corrected in subsequent editions. All images by Richard Barnes unless otherwise noted. Photo credits: pp. vi-v: IIT Residence Halls © Chicago Historical Society, HB 18783-D, photographer Hedrich Blessing pp. viii-ix: Alumni Memorial Hall © Chicago Historical Society, HB-9767-A, photographer Hedrich Blessing pp. xvi, 1, 2, 3, 4, 5, 6, 8, 11, 29, 43, 48, 64, 72 top, 75, 79, 94: Reproduced by permission of University Archives, Paul V. Galvin Library, Illinois Institute of Technology, Chicago. IIT has made every reasonable attempt to identify owners of copyright. Errors or omissions will be corrected in subsequent editions.