Normal view MARC view ISBD view

Digital system test and testable design : using HDL models and architectures

By: Navabi, Zainalabedin.
Material type: materialTypeLabelBookPublisher: New York Springer 2011Description: xxiii, 435p.ISBN: 9781441975478.Subject(s): Syetems on a chipDDC classification: 621.3815 | N227d
    average rating: 0.0 (0 votes)
Item type Current location Collection Call number Status Date due Barcode Item holds
Books Books P K Kelkar Library, IIT Kanpur
General Stacks 621.3815 N227d (Browse shelf) Available A171275
Total holds: 0

There are no comments for this item.

Log in to your account to post a comment.

Powered by Koha